Highlights

Susi, T.et al.Single-atom spectroscopy of phosphorus dopants implanted into graphene, 2D Materials 4, 021013 (2017). doi:10.1088/2053-1583/aa5e78

Susi, T.et al.Nitrogen-Doped Single-Walled Carbon Nanotube Thin Films Exhibiting Anomalous Sheet Resistances, Chem. Mater. 23, 2201-2208 (2011). doi: 10.1021/cm200111b

Susi, T.et al.Nitrogen-doped SWCNTs synthesized using ammonia and carbon monoxide, Phys. Stat. Solidi B 247, 2726-2729 (2010). doi: 10.1002/pssb.201000312

Electron energy loss spectroscopy

Recent advances in instrumentation have made it possible to identify the composition of materials at the atomic scale using electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). When combined with modeling, even the exact nature of the bonding of single atoms can be elucidated.

 The inset images show energy ranges corresponding to the P  L -edge and C  K -edge mapped over a single phosphorus dopant implanted into graphene. (doi: 10.1088/2053-1583/aa5e78

The inset images show energy ranges corresponding to the P L-edge and C K-edge mapped over a single phosphorus dopant implanted into graphene. (doi:10.1088/2053-1583/aa5e78